There are many factors involved when choosing the components for your board assembly.   Whether it is a consumer, aerospace, down-hole drilling,  industrial, or test boards – At KES, we help our customers by selecting the parts for their Bill Of Materials (BOM) based on their criteria and the application. Here are a few guidelines for anyone designing an electronic product that will help them Read more…


Costs of Battery Electric Vehicles (BEVs) are projected to reach parity with Internal Combustion vehicles

Bert Templeton – June 24, 2020 Bert Templeton – June 24, 2020 The growth of electronics, and along with it, semiconductor content in the automotive industry, continues to climb at a healthy rate, outpacing most other segments. Analyst estimates indicate that the CAGR of automotive electronics will grow at nearly five and a half percent through 2021. That is roughly triple the rate of Read more…


Semiconductor Burn-In KES Systems

Semiconductor burn-in is a method for detecting early failures in semiconductor devices. This is also called, ‘infant mortality’. It requires the testing of devices under a set of stress conditions that usually involves an elevated temperature of 125° C to 150° C (commonly, some ‘high reliability” device can be tested at 200° C or higher) for a set number of hours. During that time Read more…


HAST and burn-in design in CAD tools for semiconductos and other applications

HAST BOARD DESIGN GUIDELINES THB and HAST board DESIGN THB (Temperature Humidity Bias) and HAST (Highly-Accelerated Stress) Test boards are used to qualify device packages. These tests are used to evaluate the reliability of non-hermetic packaged devices in humid environments. There are important guidelines that must be followed when designing these types of Burn-In Boards to prevent premature failures in this harsh environment. Below Read more…


HAST Chamber

The most common types of reliability tests for semiconductors are; burn-in, power temp cycle (PTC), and HAST. Burn-in Burn-in tests check the reliability of the semiconductor device and are typically done at 125ºC or 150ºC, while electrical signals and power are applied to ASICs. Burn-in boards are put into the burn-in system which supplies the necessary power and stimulus to the samples while maintaining Read more…


KES Systems a leader in burn-in technologiesexhibits at Photonics WEST

KES Systems, a world leader in burn-in technologies,  WLBI and SLT will be at Booth #5585 at Photonics WEST, The leading event for the photonics and laser communities.  Our high-power Hyperion LED tester can handle the highest power wafer-level burn-in challenges in the industry.   Visit our booth to learn more. Photonics WEST is at the Moscone Center in San Francisco and will be held Read more…

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